Reflection plane placement in numerical inductance calculations using the method of images for thin-film superconducting structures

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dc.contributor.authorFourie C.J.
dc.contributor.authorPerold W.J.
dc.date.accessioned2011-05-15T16:00:43Z
dc.date.available2011-05-15T16:00:43Z
dc.date.issued2003
dc.description.abstractAccurate calculation of the inductance of thin film structures in sub-Terahertz superconducting logic circuits is extremely important. For a numerical analysis, both the structure and ground plane need to be sufficiently segmented. The method of images significantly reduces the number of segments required, but the selection of the position of the reflection plane is critical. The influence of the position of the reflection plane on inductance is investigated, and results presented. A study of segmentation and filamentation is also made, and these results are used to calculate the inductance of a complex three-dimensional structure. Copyright © 2002 IEEE.
dc.description.versionConference Paper
dc.identifier.citationTransactions of the South African Institute of Electrical Engineers
dc.identifier.citation94
dc.identifier.citation2
dc.identifier.issn382221
dc.identifier.urihttp://hdl.handle.net/10019.1/11840
dc.subjectEtching
dc.subjectInductance measurement
dc.subjectLogic circuits
dc.subjectLogic gates
dc.subjectMonte Carlo methods
dc.subjectThin films
dc.subjectMethod of images
dc.subjectNumerical inductance calculation
dc.subjectReflection plane
dc.subjectThin-film superonducting structures
dc.subjectSuperconducting devices
dc.titleReflection plane placement in numerical inductance calculations using the method of images for thin-film superconducting structures
dc.typeConference Paper
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