Advantages of scanning probe microscopy in polymer science

dc.contributor.authorMeincken, M.en_ZA
dc.contributor.authorSanderson, R. D.en_ZA
dc.date.accessioned2011-05-15T15:55:16Z
dc.date.available2011-05-15T15:55:16Z
dc.date.issued2004
dc.descriptionCITATION: Meincken, M. & Sanderson, R. D. 2004. Advantages of scanning probe microscopy in polymer science. South African Journal of Science, 100(05-06):256-260.
dc.descriptionThe original publication is available at https://journals.co.za
dc.description.abstractWe introduce the atomic force microscope (AFM) and its capabilities with special regard to its use in polymer science. It shows several advantages over other analytical techniques, such as scanning electron microscopy, differential scanning calorimetry, and dynamic mechanical analysis. Its main advantage is that the samples need not be prepared specially and can therefore be studied in their native environment. Further-more, the AFM can be used to detect physical properties locally on a molecular scale, which may be of interest for characterizing polymer blends or structured polymers.
dc.description.urihttps://journals.co.za/content/sajsci/100/5-6/EJC96261
dc.description.versionPublisher's version
dc.format.extent5 pages
dc.identifier.citationMeincken, M. & Sanderson, R. D. 2004. Advantages of scanning probe microscopy in polymer science. South African Journal of Science, 100(05-06):256-260
dc.identifier.issn1996-7489 (online)
dc.identifier.issn0038-2353 (print)
dc.identifier.urihttp://hdl.handle.net/10019.1/9684
dc.language.isoen_ZAen_ZA
dc.publisherAcademy of Science for South Africa
dc.rights.holderAcademy of Science for South Africa
dc.subjectMicroscopy
dc.subjectScanning probe microscopy
dc.subjectPolymers
dc.titleAdvantages of scanning probe microscopy in polymer scienceen_ZA
dc.typeArticle
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