Advantages of scanning probe microscopy in polymer science
Date
2004
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Academy of Science for South Africa
Abstract
We introduce the atomic force microscope (AFM) and its capabilities with special regard to its use in polymer science. It shows several advantages over other analytical techniques, such as scanning electron microscopy, differential scanning calorimetry, and dynamic mechanical analysis. Its main advantage is that the samples need not be prepared specially and can therefore be studied in their native environment. Further-more, the AFM can be used to detect physical properties locally on a molecular scale, which may be of interest for characterizing polymer blends or structured polymers.
Description
CITATION: Meincken, M. & Sanderson, R. D. 2004. Advantages of scanning probe microscopy in polymer science. South African Journal of Science, 100(05-06):256-260.
The original publication is available at https://journals.co.za
The original publication is available at https://journals.co.za
Keywords
Microscopy, Scanning probe microscopy, Polymers
Citation
Meincken, M. & Sanderson, R. D. 2004. Advantages of scanning probe microscopy in polymer science. South African Journal of Science, 100(05-06):256-260