Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces
Date
2004
Authors
Scheidt T
Rohwer EG
Von Bergmann HM
Stafast H
Journal Title
Journal ISSN
Volume Title
Publisher
E D P SCIENCES, 7, AVE DU HOGGAR, PARC D ACTIVITES COURTABOEUF, BP 112, LESULIS CEDEXA, FRANCE, F-91944
Abstract
Description
Natuurwetenskappe
Fisika
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Fisika
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Keywords
Citation
European Physical Journal-Applied Physics