Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces

Scheidt T ; Rohwer EG ; Von Bergmann HM ; Stafast H (2004)



Please help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za

Journal Articles (subsidised)

Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/79096
This item appears in the following collections: