Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces
dc.contributor.author | Scheidt T | |
dc.contributor.author | Rohwer EG | |
dc.contributor.author | Von Bergmann HM | |
dc.contributor.author | Stafast H | |
dc.date.accessioned | 2013-01-23T14:11:31Z | |
dc.date.available | 2013-01-23T14:11:31Z | |
dc.date.issued | 2004 | |
dc.description | Natuurwetenskappe | |
dc.description | Fisika | |
dc.description | Please help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za | |
dc.identifier.citation | European Physical Journal-Applied Physics | |
dc.identifier.uri | http://hdl.handle.net/10019.1/79096 | |
dc.publisher | E D P SCIENCES, 7, AVE DU HOGGAR, PARC D ACTIVITES COURTABOEUF, BP 112, LESULIS CEDEXA, FRANCE, F-91944 | |
dc.title | Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces | |
dc.type | Journal Articles (subsidised) |