Parameter extraction of superconducting integrated circuits

Abstract

Integrated circuits are expensive to manufacture and it is important to verify the correct operation of a circuit before fabrication. Efficient, though accurate, parameter extraction of post-layout designs are required for estimation of circuit success rates. This thesis discusses electrical netlist and fast parameter extraction techniques suited for both intraand inter-gate connections. This includes the use of extraction windows and look-up tables (LUTs) for accurate inductance and capacitance estimation. These techniques can readily be implemented in automated layout software where fast parameter extraction is required for timing analysis and gate placement.