Femtosecond laser diagnostics of the built-in electric field across the p<SUP>+</SUP>-Si/SiO<SUB>2 </SUB>interface and its ultrafast shielding

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dc.contributor.authorNeethling PH
dc.contributor.authorRohwer EG
dc.contributor.authorStafast H
dc.date.accessioned2014-07-07T12:13:46Z
dc.date.available2014-07-07T12:13:46Z
dc.date.issued2013
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dc.descriptionJournal Articles (subsidised)
dc.descriptionNatuurwetenskappe
dc.descriptionFisika
dc.identifier.citationJournal of Applied Physics
dc.identifier.citation113
dc.identifier.urihttp://hdl.handle.net/10019.1/92375
dc.publisherAMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE1 N O 1, MELVILLE, USA, NY, 11747-4501
dc.titleFemtosecond laser diagnostics of the built-in electric field across the p<SUP>+</SUP>-Si/SiO<SUB>2 </SUB>interface and its ultrafast shielding
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