Monitoring of Process Systems with Topographic Projection Methods.

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dc.contributor.authorWang Q
dc.contributor.authorAldrich C
dc.date.accessioned2012-08-10T20:00:21Z
dc.date.available2012-08-10T20:00:21Z
dc.date.issued2009
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.descriptionIngenieurswese
dc.descriptionProsesingenieurswese
dc.identifier.urihttp://hdl.handle.net/10019.1/42971
dc.titleMonitoring of Process Systems with Topographic Projection Methods.
dc.typeProceedings International
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