Aspects of electron microscopic characterisation of thin solid films

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dc.contributor.authorChurms, C. L.(Cecil Lindsay)
dc.contributor.otherStellenbosch University. Faculty of . Dept. of .
dc.date.accessioned2012-08-27T11:38:36Z
dc.date.available2012-08-27T11:38:36Z
dc.date.issued1985
dc.descriptionThesis (M.Sc.) -- University of Stellenbosch, 1985.
dc.descriptionFull text to be digitised and attached to bibliographic record.
dc.format.extent1 v. : ill.
dc.identifier.urihttp://hdl.handle.net/10019.1/57669
dc.language.isoen_ZA
dc.publisherStellenbosch : Stellenbosch University
dc.rights.holderStellenbosch University
dc.subjectThin films
dc.subjectElectron microscopy
dc.subjectDissertations -- Physics
dc.titleAspects of electron microscopic characterisation of thin solid films
dc.typeThesis
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