Application of the Characteristic Basis Function Pattern Method to Reflector Surface Inaccuracies and Sidelobe Modeling
dc.contributor.author | Young A | |
dc.contributor.author | Maaskant R | |
dc.contributor.author | Ivashina MV | |
dc.contributor.author | Davidson DB | |
dc.date.accessioned | 2014-07-06T17:27:20Z | |
dc.date.available | 2014-07-06T17:27:20Z | |
dc.date.issued | 2013 | |
dc.description | Please help populate SUNScholar with the full text of SU research output. Also - should you need this item urgently, please send us the details and we will try to get hold of the full text as quick possible. E-mail to scholar@sun.ac.za. Thank you. | |
dc.description | Ingenieurswese | |
dc.description | Elektriese En Elektroniese Ingenie | |
dc.identifier.citation | 555 | |
dc.identifier.citation | 558 | |
dc.identifier.uri | http://hdl.handle.net/10019.1/89295 | |
dc.publisher | ICEAA | |
dc.title | Application of the Characteristic Basis Function Pattern Method to Reflector Surface Inaccuracies and Sidelobe Modeling | |
dc.type | Proceedings International |