Charge-carrier dynamics and trap generation in native Si/SiO<SUB>2</SUB> interfaces probed by optical second-harmonic generation

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dc.contributor.authorScheidt T
dc.contributor.authorRohwer EG
dc.contributor.authorVon Bergmann HM
dc.contributor.authorStafast H
dc.date.accessioned2013-01-23T14:11:31Z
dc.date.available2013-01-23T14:11:31Z
dc.date.issued2004
dc.descriptionNatuurwetenskappe
dc.descriptionFisika
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.identifier.citationPhysica B-Condensed Matter
dc.identifier.urihttp://hdl.handle.net/10019.1/79097
dc.publisherELSEVIER SCIENCE BV, PO BOX 211, AMSTERDAM, NETHERLANDS, 1000 AE
dc.titleCharge-carrier dynamics and trap generation in native Si/SiO<SUB>2</SUB> interfaces probed by optical second-harmonic generation
dc.typeJournal Articles (subsidised)
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