Charge-carrier dynamics and trap generation in native Si/SiO<SUB>2</SUB> interfaces probed by optical second-harmonic generation
dc.contributor.author | Scheidt T | |
dc.contributor.author | Rohwer EG | |
dc.contributor.author | Von Bergmann HM | |
dc.contributor.author | Stafast H | |
dc.date.accessioned | 2013-01-23T14:11:31Z | |
dc.date.available | 2013-01-23T14:11:31Z | |
dc.date.issued | 2004 | |
dc.description | Natuurwetenskappe | |
dc.description | Fisika | |
dc.description | Please help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za | |
dc.identifier.citation | Physica B-Condensed Matter | |
dc.identifier.uri | http://hdl.handle.net/10019.1/79097 | |
dc.publisher | ELSEVIER SCIENCE BV, PO BOX 211, AMSTERDAM, NETHERLANDS, 1000 AE | |
dc.title | Charge-carrier dynamics and trap generation in native Si/SiO<SUB>2</SUB> interfaces probed by optical second-harmonic generation | |
dc.type | Journal Articles (subsidised) |