Using planar near-field measurement for microwave holographic diagnosis

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dc.contributor.authorTheunissen, W. H.(Wilhelmus Hendrikus)
dc.contributor.otherStellenbosch University. Faculty of . Dept. of .
dc.date.accessioned2012-08-27T12:26:54Z
dc.date.available2012-08-27T12:26:54Z
dc.date.issued1990
dc.descriptionThesis (M. Eng. (Electronics)) -- University of Stellenbosch, 1990.
dc.descriptionFull text to be digitised and attached to bibliographic record.
dc.format.extent134 leaves : ill.
dc.identifier.urihttp://hdl.handle.net/10019.1/69058
dc.language.isoen_ZA
dc.publisherStellenbosch : Stellenbosch University
dc.rights.holderStellenbosch University
dc.subjectMicrowave holography
dc.subjectDissertations -- Electronic engineering
dc.titleUsing planar near-field measurement for microwave holographic diagnosis
dc.typeThesis
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