First comparison of electric field induced second harmonic of NIR femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane

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dc.contributor.authorNyamuda, G. P.en_ZA
dc.contributor.authorRohwer, E. G.en_ZA
dc.contributor.authorSteenkamp, C. M.en_ZA
dc.contributor.authorStafast, H.en_ZA
dc.date.accessioned2011-10-13T16:58:47Z
dc.date.available2011-10-13T16:58:47Z
dc.date.issued2011
dc.descriptionCITATION: Nyamuda, G. P. et al. 2011. First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane. Applied Physics B, 104:735-740, doi:10.1007/s00340-011-4682-1.
dc.descriptionThe original publication is available at https://link.springer.com/journal/340
dc.description.abstractFor the first time electric field induced second harmonic (EFISH) generation of femtosecond (fs) laser pulses (λ=800 nm, τ=75±5 fs, rep. rate=80 MHz, Epulse≤10 nJ) is observed in transmission through a thin free-standing silicon (Si) membrane of 10-μm thickness and compared to the well-known EFISH results in reflection by use of the z-scan technique. EFISH in reflection and transmission unequivocally originate from the front and rear Si/SiO2 interfaces, respectively, with SiO2 being the natural oxide on the Si surfaces. Frequency conversion is enhanced by photoinduced electric fields across the Si/SiO2 interfaces caused by charge-carrier injection from Si into the oxide. The z-scan results and time-dependent measurements allow comparison of the EFISH signal amplitudes and time constants detected in transmission and reflection, demonstrating the need for further investigation. © 2011 Springer-Verlag.en_ZA
dc.description.versionPost-print
dc.format.extent16 pages
dc.identifier.citationNyamuda, G. P. et al. 2011. First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane. Applied Physics B, 104:735-740, doi:10.1007/s00340-011-4682-1.
dc.identifier.issn0946-2171 (print)
dc.identifier.issn1432-0649 (online)
dc.identifier.otherdoi:10.1007/s00340-011-4682-1
dc.identifier.urihttp://hdl.handle.net/10019.1/16854
dc.language.isoen
dc.publisherSpringer
dc.subjectSecond harmonic generationen_ZA
dc.subjectNear infrared reflectance spectroscopyen_ZA
dc.subjectFemtosecond lasersen_ZA
dc.subjectLaser pulses, Ultrashorten_ZA
dc.subjectMembranes, Siliconen_ZA
dc.titleFirst comparison of electric field induced second harmonic of NIR femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membraneen_ZA
dc.typeArticle
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