A biometrical study of some of the components of yield in wheat

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dc.contributor.authorSchweppenhauser, M. A.(Michael Andrew)
dc.contributor.otherStellenbosch University. Faculty of . Dept. of .
dc.date.accessioned2012-08-27T11:37:59Z
dc.date.available2012-08-27T11:37:59Z
dc.date.issued1954
dc.descriptionThesis (M. Sc. Agric.) -- University of Stellenbosch, 1954.
dc.descriptionFull text to be digitised and attached to bibliographic record.
dc.format.extent27 leaves : ill.
dc.identifier.urihttp://hdl.handle.net/10019.1/56468
dc.language.isoen_ZA
dc.publisherStellenbosch : Stellenbosch University
dc.rights.holderStellenbosch University
dc.subjectWheat
dc.subjectCrop yields
dc.subjectWheat -- Yields
dc.subjectDissertations -- Agriculture
dc.titleA biometrical study of some of the components of yield in wheat
dc.typeThesis
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