Femtosecond laser diagnostics of thin films, surfaces and interfaces

dc.contributor.authorScheidt, T.en_ZA
dc.contributor.authorRohwer, E. G.en_ZA
dc.contributor.authorBergmann, H. M. V.en_ZA
dc.contributor.authorStafast, H.en_ZA
dc.date.accessioned2011-05-15T15:55:15Z
dc.date.available2011-05-15T15:55:15Z
dc.date.issued2005
dc.descriptionCITATION: Scheidt, T., et al. 2005. Femtosecond laser diagnostics of thin films, surfaces and interfaces. South African Journal of Science, 101(5-6):267-271.
dc.descriptionThe original publication is available at https://journals.co.za
dc.description.abstractAn overview is given of optical second harmonic generation (SHG) using femtosecond laser pulses to analyse technologically important crystalline materials. The principle of SHG is briefly explained and a typical experimental setup for SHG is outlined. The second harmonic (SH) measurements performed in prototype compound semiconductors reveal the crystalline structure and orientation of monocrystalline SiC, polycrystalline ZnO, and the ternary compound, PbxCd1-xTe, showing the segregation of a Pb-and a Cd-rich phase. Furthermore, SHG can selectively probe the Si/SiO2 interface and the build-up of its electric field induced by laser-activated charge carrier separation. The examples presented demonstrate that SHG is a versatile technique to probe the structural and electronic properties of crystalline materials and particularly surfaces and interfaces.
dc.description.urihttps://journals.co.za/content/sajsci/101/5-6/EJC96406
dc.description.versionPublisher's version
dc.format.extent5 pages
dc.identifier.citationScheidt, T., et al. 2005. Femtosecond laser diagnostics of thin films, surfaces and interfaces. South African Journal of Science, 101(5-6):267-271
dc.identifier.issn1996-7489 (online)
dc.identifier.issn0038-2353 (print)
dc.identifier.urihttp://hdl.handle.net/10019.1/9667
dc.language.isoen_ZAen_ZA
dc.publisherAcademy of Science for South Africa
dc.rights.holderAcademy of Science for South Africa
dc.subjectCrystalline interfaces
dc.subjectFemtosecond lasers
dc.titleFemtosecond laser diagnostics of thin films, surfaces and interfacesen_ZA
dc.typeOther
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