Femtosecond laser diagnostics of the built-in electric field across the p<SUP>+</SUP>-Si/SiO<SUB>2 </SUB>interface and its ultrafast shielding

Neethling PH ; Rohwer EG ; Stafast H (2013)

Please help populate SUNScholar with the full text of SU research output. Also - should you need this item urgently, please send us the details and we will try to get hold of the full text as quick possible. E-mail to scholar@sun.ac.za. Thank you.

Journal Articles (subsidised)



Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/92375
This item appears in the following collections: