Lifetime measurements on 26Mg and 29Si by Doppler shift attenuation

Date
1970
Authors
De Kock P.R.
Koen J.W.
Mouton W.L.
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Abstract
The lifetimes of the lowest bound states of 26Mg and 29Si were determined by means of Doppler shift attenuation measurements. The results are τm = 300+100-60 95±25, > 5000and 2100+4000-1000fs for 26Mg (1) through (4) and τm = 560±130, 830±260 and 24±14 fs for 29Si (1) through (3), respectively. © 1970.
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Citation
Nuclear Physics, Section A
140
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