Lifetime measurements on 26Mg and 29Si by Doppler shift attenuation

De Kock P.R. ; Koen J.W. ; Mouton W.L. (1970)


The lifetimes of the lowest bound states of 26Mg and 29Si were determined by means of Doppler shift attenuation measurements. The results are τm = 300+100-60 95±25, > 5000and 2100+4000-1000fs for 26Mg (1) through (4) and τm = 560±130, 830±260 and 24±14 fs for 29Si (1) through (3), respectively. © 1970.

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