Use of atomic force microscopy to detect wavelenth dependent changes in wood veneers, and spin coated lignin and cellulose films exposed to solar radiation

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dc.contributor.authorMeincken M
dc.contributor.authorEvans PD
dc.date.accessioned2012-08-10T22:14:40Z
dc.date.available2012-08-10T22:14:40Z
dc.date.issued2011
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.descriptionAgriwetenskappe
dc.descriptionBos-en Houtkunde
dc.identifier.urihttp://hdl.handle.net/10019.1/44623
dc.publisherInternational Wood Products Journal
dc.titleUse of atomic force microscopy to detect wavelenth dependent changes in wood veneers, and spin coated lignin and cellulose films exposed to solar radiation
dc.typeJournal Articles (NON-subsidised)
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