First comparison of electric field induced second harmonic of NIR femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane

Date
2011
Journal Title
Journal ISSN
Volume Title
Publisher
Springer
Abstract
For the first time electric field induced second harmonic (EFISH) generation of femtosecond (fs) laser pulses (λ=800 nm, τ=75±5 fs, rep. rate=80 MHz, Epulse≤10 nJ) is observed in transmission through a thin free-standing silicon (Si) membrane of 10-μm thickness and compared to the well-known EFISH results in reflection by use of the z-scan technique. EFISH in reflection and transmission unequivocally originate from the front and rear Si/SiO2 interfaces, respectively, with SiO2 being the natural oxide on the Si surfaces. Frequency conversion is enhanced by photoinduced electric fields across the Si/SiO2 interfaces caused by charge-carrier injection from Si into the oxide. The z-scan results and time-dependent measurements allow comparison of the EFISH signal amplitudes and time constants detected in transmission and reflection, demonstrating the need for further investigation. © 2011 Springer-Verlag.
Description
CITATION: Nyamuda, G. P. et al. 2011. First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane. Applied Physics B, 104:735-740, doi:10.1007/s00340-011-4682-1.
The original publication is available at https://link.springer.com/journal/340
Keywords
Second harmonic generation, Near infrared reflectance spectroscopy, Femtosecond lasers, Laser pulses, Ultrashort, Membranes, Silicon
Citation
Nyamuda, G. P. et al. 2011. First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane. Applied Physics B, 104:735-740, doi:10.1007/s00340-011-4682-1.