Femtosecond laser diagnostics of the built-in electric field across the p<SUP>+</SUP>-Si/SiO<SUB>2 </SUB>interface and its ultrafast shielding

Date
2013
Authors
Neethling PH
Rohwer EG
Stafast H
Journal Title
Journal ISSN
Volume Title
Publisher
AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE1 N O 1, MELVILLE, USA, NY, 11747-4501
Abstract
Description
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Journal Articles (subsidised)
Natuurwetenskappe
Fisika
Keywords
Citation
Journal of Applied Physics
113
URI
http://hdl.handle.net/10019.1/92375
Collections
2013 - Research Outputs (Accredited)