Recent developments in non-linear device modelling techniques
Date
1999
Authors
van Niekerk Cornell
Schreurs Dominique
Meyer Petrie
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Abstract
An overview of recent developments in device modelling work performed at the University of Stellenbosch and the Catholic University of Leuven is presented. Results describing an accurate and robust multi-bias model extraction algorithm is presented. An introduction is also provided to the Non-linear Network Measurement System (NNMS) and results are presented to illustrate the implications for non-linear modelling and design.
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IEEE AFRICON Conference
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