Reflection plane placement in numerical inductance calculations using the method of images for thin-film superconducting structures
Date
2003
Authors
Fourie C.J.
Perold W.J.
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Accurate calculation of the inductance of thin film structures in sub-Terahertz superconducting logic circuits is extremely important. For a numerical analysis, both the structure and ground plane need to be sufficiently segmented. The method of images significantly reduces the number of segments required, but the selection of the position of the reflection plane is critical. The influence of the position of the reflection plane on inductance is investigated, and results presented. A study of segmentation and filamentation is also made, and these results are used to calculate the inductance of a complex three-dimensional structure. Copyright © 2002 IEEE.
Description
Keywords
Etching, Inductance measurement, Logic circuits, Logic gates, Monte Carlo methods, Thin films, Method of images, Numerical inductance calculation, Reflection plane, Thin-film superonducting structures, Superconducting devices
Citation
Transactions of the South African Institute of Electrical Engineers
94
2
94
2