Measurement of thermal parameters and mechanical properties of polymers by atomic force microscopy.

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dc.contributor.authorMeincken M
dc.contributor.authorBalk LJ
dc.contributor.authorSanderson RD
dc.date.accessioned2013-01-23T13:46:34Z
dc.date.available2013-01-23T13:46:34Z
dc.date.issued2003
dc.descriptionNatuurwetenskappe
dc.descriptionInstituut Vir Polimeerwetenskap
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.identifier.citationSurface and Interface Analysis
dc.identifier.urihttp://hdl.handle.net/10019.1/76683
dc.publisherSTANFORD LAW SCHOOL, STANFORD JOURNAL INT LAW, 559 NATHAN ABBOTT WAY, STANFORD, USA, CA, 94305-8610
dc.titleMeasurement of thermal parameters and mechanical properties of polymers by atomic force microscopy.
dc.typeJournal Articles (subsidised)
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