The use of parallel mechanism micro-CMM in micrometrology

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dc.contributor.authorRugbani AM
dc.contributor.authorSchreve K
dc.date.accessioned2012-08-11T01:31:48Z
dc.date.available2012-08-11T01:31:48Z
dc.date.issued2011
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.descriptionIngenieurswese
dc.descriptionMeganiese & Megatroniese Ingenieurswese
dc.identifier.urihttp://hdl.handle.net/10019.1/46987
dc.titleThe use of parallel mechanism micro-CMM in micrometrology
dc.typeProceedings International
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