The One Eye and Two Ears of EMC: Metrology

Simple item page
dc.contributor.authorReader HC
dc.contributor.authorUrban RG
dc.contributor.authorGeschke RH
dc.date.accessioned2012-08-10T16:52:01Z
dc.date.available2012-08-10T16:52:01Z
dc.date.issued2005
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.descriptionIngenieurswese
dc.descriptionElektriese En Elektroniese Ingenie
dc.identifier.urihttp://hdl.handle.net/10019.1/40337
dc.titleThe One Eye and Two Ears of EMC: Metrology
dc.typeProceedings National
Files
Collections
2005 - Research Outputs