Development of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures

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dc.contributor.authorvan Niekerk C.
dc.contributor.authorMeyer P.
dc.date.accessioned2011-05-15T15:53:42Z
dc.date.available2011-05-15T15:53:42Z
dc.date.issued1996
dc.description.abstractThe development of a TRL calibration and test fixture for vector network analyzer measurements of microwave transistors at cryogenic temperatures, is presented. While capable of withstanding the severe environmental changes incurred by cooling to low temperatures, the fixture is simpler than similar existing fixtures. Measurements are presented to illustrate the repeatability of the fixture.
dc.description.versionConference Paper
dc.identifier.citationIEEE AFRICON Conference
dc.identifier.citation2
dc.identifier.urihttp://hdl.handle.net/10019.1/8765
dc.titleDevelopment of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures
dc.typeConference Paper
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