Lifetime measurements on 26Mg and 29Si by Doppler shift attenuation

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dc.contributor.authorDe Kock P.R.
dc.contributor.authorKoen J.W.
dc.contributor.authorMouton W.L.
dc.date.accessioned2011-05-15T16:02:11Z
dc.date.available2011-05-15T16:02:11Z
dc.date.issued1970
dc.description.abstractThe lifetimes of the lowest bound states of 26Mg and 29Si were determined by means of Doppler shift attenuation measurements. The results are τm = 300+100-60 95±25, > 5000and 2100+4000-1000fs for 26Mg (1) through (4) and τm = 560±130, 830±260 and 24±14 fs for 29Si (1) through (3), respectively. © 1970.
dc.description.versionArticle
dc.identifier.citationNuclear Physics, Section A
dc.identifier.citation140
dc.identifier.citation1
dc.identifier.issn3759474
dc.identifier.urihttp://hdl.handle.net/10019.1/12349
dc.titleLifetime measurements on 26Mg and 29Si by Doppler shift attenuation
dc.typeArticle
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