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Application of the Characteristic Basis Function Pattern Method to Reflector Surface Inaccuracies and Sidelobe Modeling

dc.contributor.authorYoung A
dc.contributor.authorMaaskant R
dc.contributor.authorIvashina MV
dc.contributor.authorDavidson DB
dc.date.accessioned2014-07-06T17:27:20Z
dc.date.available2014-07-06T17:27:20Z
dc.date.issued2013
dc.identifier.citation555
dc.identifier.citation558
dc.identifier.urihttp://hdl.handle.net/10019.1/89295
dc.descriptionPlease help populate SUNScholar with the full text of SU research output. Also - should you need this item urgently, please send us the details and we will try to get hold of the full text as quick possible. E-mail to scholar@sun.ac.za. Thank you.
dc.descriptionIngenieurswese
dc.descriptionElektriese En Elektroniese Ingenie
dc.publisherICEAA
dc.titleApplication of the Characteristic Basis Function Pattern Method to Reflector Surface Inaccuracies and Sidelobe Modeling
dc.typeProceedings International


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