ITEM VIEW

MeerKAT RFI Environment Modeling and Metrology

dc.contributor.authorReader HC
dc.contributor.authorOtto AJ
dc.contributor.authorvan der Merwe PS
dc.contributor.authorWiid PG
dc.contributor.authorAndriambeloson JA
dc.date.accessioned2013-07-03T08:32:06Z
dc.date.available2013-07-03T08:32:06Z
dc.date.issued2012
dc.identifier.urihttp://hdl.handle.net/10019.1/83848
dc.descriptionIngenieurswese
dc.descriptionElektriese En Elektroniese Ingenie
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.publisherIEEE
dc.titleMeerKAT RFI Environment Modeling and Metrology
dc.typeProceedings International


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

ITEM VIEW