Charge-carrier dynamics and trap generation in native Si/SiO<SUB>2</SUB> interfaces probed by optical second-harmonic generation
Date
2004
Authors
Scheidt T
Rohwer EG
Von Bergmann HM
Stafast H
Journal Title
Journal ISSN
Volume Title
Publisher
ELSEVIER SCIENCE BV, PO BOX 211, AMSTERDAM, NETHERLANDS, 1000 AE
Abstract
Description
Natuurwetenskappe
Fisika
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Fisika
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Keywords
Citation
Physica B-Condensed Matter