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A New Hybrid/Decomposition-based FET Parameter Extraction Algorithm with Intelligent Bias Point Selection

dc.contributor.authorVan Niekerk C
dc.contributor.authorDu Preez JA
dc.contributor.authorSchreurs DMM-P
dc.date.accessioned2013-01-23T13:46:44Z
dc.date.available2013-01-23T13:46:44Z
dc.date.issued2003
dc.identifier.citationIeee Transactions on Microwave Theory and Techniques
dc.identifier.urihttp://hdl.handle.net/10019.1/76923
dc.descriptionIngenieurswese
dc.descriptionElektriese En Elektroniese Ingenie
dc.descriptionPlease help us populate SUNScholar with the post print version of this article. It can be e-mailed to: scholar@sun.ac.za
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY,USA, NJ, 08855
dc.titleA New Hybrid/Decomposition-based FET Parameter Extraction Algorithm with Intelligent Bias Point Selection
dc.typeJournal Articles (subsidised)


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