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The selection and single event upset testing of a DSP processor for a LEO satellite

dc.contributor.advisorBlanckenberg, M. M.
dc.contributor.authorBerner, Heiko
dc.contributor.otherStellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering.en_ZA
dc.date.accessioned2012-08-27T11:35:20Z
dc.date.available2012-08-27T11:35:20Z
dc.date.issued2002-03
dc.identifier.urihttp://hdl.handle.net/10019.1/53171
dc.descriptionThesis (MScEng)--University of Stellenbosch, 2002.en_ZA
dc.description.abstractENGLISH ABSTRACT: After successful use of a DSP processor onboard the SUNSAT satellite, the need arose for a faster floating-point processor. A list of possible processors was generated from various selection criteria. Two suitable DSP processors were chosen, and because no radiation information was available for one of them, the decision was made to perform radiation tests on it. The procedures used to test the processor are described in detail so the same methods can be used for future radiation tests. An error detection and correction circuit was implemented to check and correct upsets in the on-chip memory of the DSP processor. This ensures that the processor code and data stays intact.en_ZA
dc.description.abstractAFRIKAANSE OPSOMMING: Na suksesvolle gebruik van 'n DSP verwerker aanboord die SUNSAT satelliet het die behoefte ontstaan vir 'n vinniger wissel-punt verwerker. 'n Lys van moontlike verwerkers is opgestel met die hulp van verskeie seleksie kriteria. Twee geskikte DSP verwerkers is gekies, en omdat geen radiasie informasie vir die een beskikbaar was nie, is besluit om radiasie toetse op hom te doen. Die prosedures gebruik om die verwerker te toets word deeglik beskryf sodat dieselfde metodes in die toekom gebruik kan word. 'n Fout deteksie en korreksie baan is geimplementeer om foute in die aanboord geheue van die DSP verwerker op te spoor en te korrigeer. Dit verseker dat die verwerker se kode en data intak bly.af_ZA
dc.format.extent180 p. : ill.
dc.language.isoen_ZAen_ZA
dc.publisherStellenbosch : Stellenbosch Universityen_ZA
dc.subjectSignal processing -- Digital techniquesen_ZA
dc.subjectMicroprocessors -- Testingen_ZA
dc.subjectElectronic apparatus and appliances -- Effect of radiation onen_ZA
dc.subjectDissertations -- Electrical and electronic engineeringen_ZA
dc.subjectTheses -- Electrical and electronic engineeringen_ZA
dc.titleThe selection and single event upset testing of a DSP processor for a LEO satelliteen_ZA
dc.typeThesisen_ZA
dc.rights.holderStellenbosch Universityen_ZA


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