Target characterization by PIXE, alpha spectrometry and X-ray absorption

Date
2011
Authors
Kheswa N.Y.
Papka P.
Pineda-Vargas C.A.
Newman R.T.
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
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Keywords
Absorption spectrometry, Alpha spectrometry, Metallic targets, Particle induced X-ray emission, PIXE, Target characterization, Absorption, Alpha particle spectrometers, Characterization, Ion beams, Spectrometry, X ray absorption, X rays, Zirconium, Absorption spectroscopy
Citation
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
655
1
http://www.scopus.com/inward/record.url?eid=2-s2.0-80053187491&partnerID=40&md5=a95f5643d556421fd312a82b5051b82b
URI
http://hdl.handle.net/10019.1/19222
Collections
Stellenbosch University - Scopus Publications