Automated parameter extraction for Single Flux Quantum integrated circuits with LVS

Roberts, Rebecca Mimi Catherina (2015-03)

Thesis (MEng)--Stellenbosch University, 2015.

Thesis

ENGLISH ABSTRACT: Thorough layout verification of superconductor integrated circuits goes beyond design rule checking and parameter value extraction. The former is used to verify adherence to process design rules, and the latter to determine the element values of components such as inductors and resistors and Josephson junction critical currents. Still, neither gives much warning against subtle layout errors that could result in unintended parasitic elements, or a circuit that does not reflect the original circuit topology. A specialized implementation for Cadence Virtuoso allows layout-versus-schematic verification, but it is limited both to commercial software and in terms of its usefulness. Parameter extraction software such as InductEx is used to extract the component element values of a circuit from its layout if the circuit topology is provided as a netlist, which is mostly created by the designer. However, the element values are extracted for the supplied topology, even if a layout mistake such as creating a connection to the wrong node or a mistake in the netlist results in a model mismatch. After a failed verification, further diagnosis is required to determine whether the error is indeed in the layout or in the input topology - prolonging the verification process significantly. Here we present a free-standing layout-versus-schematic verification toolkit for superconductive integrated circuits, and discuss its implementation after systematically considering the algorithms at its core. We demonstrate results of the layout-versus-schematic verification and how the layout-versus-schematic toolkit is used as a whole in conjunction with InductEx to perform automated parameter extraction for cell-level layout verification. The current version of this toolkit provides the user with three stand-alone tools that are best used in conjunction with InductEx: A GDSII file flattener, a layout-to-schematic netlist extractor (with the option of viewing a pictorial reconstruction of the netlist and schematic) and a netlist comparison tool by which the user can determine whether a layout agrees with an input schematic. We conclude that the netlist comparison and viewing tool provides a valuable method for expediting the layout verification process, making it more efficient and minimizing the chances of mistakes. In its current form the layout-to schematic tool is still limited in that it cannot yet fully support circuits with mutual coupling. Although many improvements can still be made to this toolkit, the implemented version of these tools can already provide great benefit to Rapid Single Flux quantum (RSFQ) cell designers.

AFRIKAANSE OPSOMMING: Deeglike uitleg verifikasie van supergeleier geïntegreerde stroombane strek verder as bloot die nasien van ontwerpreëls en die onttrekking van parameter waardes. Eersgenoemde word gebruik om vas te stel of daar voldoen word aan die proses se ontwerpreëls, en laasgenoemde om die waardes van komponente soos induktors en resistors en die kritiese strome van Josephson aansluitings te bepaal. Nogtans bied nie een van hulle veel waarskuwing teen subtiele uitlegfoute wat onbeplande parasitiese elemente kan veroorsaak nie, of teen ‘n stroombaan wat nie die oorspronklike stroombaan topologie weerspieël nie. ‘n Gespesialiseerde implementasie van Cadence Virtuoso maak LVS (layout-versus-schematic) verifikasie moontlik, maar dit is beperk tot kommersiële sagteware en ook beperk in terme van bruikbaarheid. Parameter onttrekking sagteware soos InductEx word gebruik om waardes van die komponent-elemente van ‘n stroombaan vanuit die uitleg te onttrek wanneeer die stroombaan topologie as ‘n netlist, wat meestal deur die ontwerper geskep is, voorsien word. Die elementwaardes word egter onttrek volgens die topologie wat verskaf is, al is daar uitlegfoute, soos byvoorbeeld wanneer ‘n koppeling met ‘n verkeerde node plaasvind, of wanneer daar netlist foute is wat modelteenstrydighede veroorsaak. Na ‘n mislukte verifikasie poging word verdere diagnostiese stappe gedoen om te bepaal of die fout in die uitleg lê, of in die spesifieke topologie wat verskaf is, wat natuurlik die verifikasieproses aansienlik verleng. Hier stel ons ‘n vrystaande LVS verifikasie sagteware-pakket vir supergeleier geïntegreerde stroombane bekend, en bespreek, deur middel van die algoritmes wat die kern daarvan uitmaak, die implementering van hierdie sagteware-toestel. Ons bied die resultate van die LVS verifikasie aan en wys hoe die LVS sagteware toestel as geheel saam met InductEx gebruik kan word om automatiese parameter uittrekking vir sel-vlak uitleg verifikasie te berwerkstellig. Die huidige weergawe van die pakket bied die verbruiker drie alleenstaande programme wat verkieslik saam met InductEx gebruik moet word: ‘n GDSII “file flattener”, ‘n uitleg-tot-schematiese diagram netlist ekstraktor (met die opsie om ‘n herkonstruktueerde beeld van netlist en skematiese diagram te besigtig) en ‘n netlist vergelyking toestel waarmee die verbruiker kan vasstel of ‘n uitleg met ‘n oorspronklike skematiese diagram ooreenstem. Ons lei af dat die netlist vergelyking toestel ‘n waardevolle metode bied om die uitleg verifikasie proses te bespoedig en vergemaklik en die kanse van foute te minimaliseer. In sy huidige vorm is die uitleg-tot-skematiese diagram toestel beperk omdat dit nog nie stroombane met koppeling kan steun nie.

Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/96992
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