Development of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures

van Niekerk C. ; Meyer P. (1996)

Conference Paper

The development of a TRL calibration and test fixture for vector network analyzer measurements of microwave transistors at cryogenic temperatures, is presented. While capable of withstanding the severe environmental changes incurred by cooling to low temperatures, the fixture is simpler than similar existing fixtures. Measurements are presented to illustrate the repeatability of the fixture.

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