Recent developments in non-linear device modelling techniques

van Niekerk Cornell ; Schreurs Dominique ; Meyer Petrie (1999)

Conference Paper

An overview of recent developments in device modelling work performed at the University of Stellenbosch and the Catholic University of Leuven is presented. Results describing an accurate and robust multi-bias model extraction algorithm is presented. An introduction is also provided to the Non-linear Network Measurement System (NNMS) and results are presented to illustrate the implications for non-linear modelling and design.

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