The selection and single event upset testing of a DSP processor for a LEO satellite

Berner, Heiko (2002-03)

Thesis (MScEng)--University of Stellenbosch, 2002.

Thesis

ENGLISH ABSTRACT: After successful use of a DSP processor onboard the SUNSAT satellite, the need arose for a faster floating-point processor. A list of possible processors was generated from various selection criteria. Two suitable DSP processors were chosen, and because no radiation information was available for one of them, the decision was made to perform radiation tests on it. The procedures used to test the processor are described in detail so the same methods can be used for future radiation tests. An error detection and correction circuit was implemented to check and correct upsets in the on-chip memory of the DSP processor. This ensures that the processor code and data stays intact.

AFRIKAANSE OPSOMMING: Na suksesvolle gebruik van 'n DSP verwerker aanboord die SUNSAT satelliet het die behoefte ontstaan vir 'n vinniger wissel-punt verwerker. 'n Lys van moontlike verwerkers is opgestel met die hulp van verskeie seleksie kriteria. Twee geskikte DSP verwerkers is gekies, en omdat geen radiasie informasie vir die een beskikbaar was nie, is besluit om radiasie toetse op hom te doen. Die prosedures gebruik om die verwerker te toets word deeglik beskryf sodat dieselfde metodes in die toekom gebruik kan word. 'n Fout deteksie en korreksie baan is geimplementeer om foute in die aanboord geheue van die DSP verwerker op te spoor en te korrigeer. Dit verseker dat die verwerker se kode en data intak bly.

Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/53171
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