GaN FETs Non-Linear Model Constructed by Adaptive multi-bias S-parameter Measurements

Xiao D ; Schreurs DMM-P ; Van Niekerk C ; De Raedt W ; Derluyn J ; Germain M ; Nauwelaars BKJC ; Borghs G (2005)

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Elektriese En Elektroniese Ingenie

Proceedings International

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