Background correction in atomic emission spectrometry using repetitive harmonic wavelength scanning and applying Fourier analysis-I. Theory

Matthee T. ; Visser K. (1995)

Article

Repetitive wavelength scanning can be used as a means of detecting and correcting for unwanted background in atomic emission spectrometry (AES). This paper deals with the theory underlying such harmonic wavelength scanning in time and stresses the relative importance of the relevant parameters. A set of integrated Turbo Pascal programs for an IBM PC was developed to provide a numerical simulation for the deconvolution of a detected spectral profile during repetitive harmonic wavelength scanning. By applying this numerical analysis the theory for separating the net spectral emission signal and the background radiation by filtering specific frequency components is investigated. It is concluded that, barring the dc component, repetitive scanning over a symmetric spectral profile leads to the generation of even-numbered Fourier harmonics at the modulation frequency, while an asymmetric spectral profile generates odd-numbered Fourier harmonics. © 1995.

Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/12525
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