Observation of shapiro-steps in AFM-plough micron-size YBCO planar constrictions

Observation of shapiro-steps in AFM-plough micron-size YBCO planar constrictions

Srinivasu V.V. ; Perold W.J. ; Srinivasu V.V. ; Perold W.J. (2009)

Conference Paper

Conference Paper

Using an Atomic Force Microscope (AFM), we successfully ploughed micron size planar constriction type junctions on YBa3Cu30 7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. We were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson effect in these constrictions. © 2009 IEEE.

Using an Atomic Force Microscope (AFM), we successfully ploughed micron size planar constriction type junctions on YBa3Cu30 7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical Magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. We were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson effect in these constrictions. © 2009 IEEE.

Please refer to this item in SUNScholar by using the following persistent URL: http://hdl.handle.net/10019.1/12109
http://hdl.handle.net/10019.1/12109
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